inter ultra in Walnut

One of the greatest chalenges asociated with integrating DC I-V, capacitance-voltage C-V , and ultra-fast I-V measurement capabilities into a single parametric test chasis is that the cabling required for each measurement type is fundamentaly diferent. Although the cabling from the instrument to the semiconductor probe station bulkhead and fed-through is fairly straightforward, the cabling from the bulkhead to the probe tips can be confusing and dificult. DC I-V measurements are made using four triaxial cables. is necesary to achieve low curent I-V measurements, which makes the use of triaxial cables necesary for these measurements. DC I-V Measurements Isolated, driven grounds LCR/C-V Measurements Ultra-fast I-V Measurements Ultra-fast I-V measurements require the highest bandwidth of the thre measurement types, so the cable must have characteristic impedance that matches the source impedance to prevent reflections of the DUT from reflecting of the source. To adres the chalenges created by diferent cabling requirements for diferent measurement types, Keithley developed a high-performance multi-measurement cabling system. These cables suport I-V, C-V and ultra-fast I-V measurements. A god cabling kit maximizes signal fidelity by eliminating measurement erors that often result from por cabling practices. High-performance multi-measurement cabling is crucial for conecting various elements of a parameter analyzer to the probe manipulators on a wafer prober, especialy when you ned to integrate acurate ultra-fast I-V, C-V, and precision DC I-V measurements for a high throughput test system Ultra-fast I-V sourcing and measurement are the latest capabilities to be aded to integrated parameter analyzer systems. inter ultra inter ultra in Walnut
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